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Knowledge-Driven Board-Level Functional Fault Diagnosis


Menge:  Stück  
Produktinformationen
cover
cover
Artikel-Nr.:
     858A-9783319402093
Hersteller:
     Springer Verlag
Herst.-Nr.:
     9783319402093
EAN/GTIN:
     9783319402093
Suchbegriffe:
Elektronik, Elektro- und Nachrichte...
Elektronik, Elektro- und Nachrichte...
allgemeine Technikbücher
allgemeine Technikbücher - englisch...
This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.o Explains and applies optimized techniques from the machine-learning       domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;o Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;o Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development.
Weitere Informationen:
Author:
Fangming Ye; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu
Verlag:
Springer International Publishing
Sprache:
eng
Weitere Suchbegriffe: allgemeine technikbücher - englischsprachig, Data Mining (EDV), Elektronik / Mikroelektronik, Mikroelektronik, Data-Driven Design of Fault Diagnosis; Design, test, and repair of 3D-Integrated Circuits; Functional Fault Diagnosis; Intelligent Fault Diagnosis; Resilient system design, Functional Fault Diagnosis, Intelligent Fault Diagnosis, Data-Driven Design of Fault Diagnosis, Resilient system design, Design, test, and repair of 3D-Integrated Circuits
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