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| Artikel-Nr.: 858A-9783319358246 Herst.-Nr.: 9783319358246 EAN/GTIN: 9783319358246 |
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| This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs' ESD safety level, while maximizing RF performance. Weitere Informationen: | | Author: | Qiang Cui; Juin J. Liou; Jean-Jacques Hajjar; Javier Salcedo; Yuanzhong Zhou; Parthasarathy Srivatsan | Verlag: | Springer International Publishing | Sprache: | eng |
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| Weitere Suchbegriffe: allgemeine technikbücher - englischsprachig, ESD Protection for BiCMOS RFICs, ESD Protection for GaAs RFICs, ESD Protection for RFICs, ESD Protection for SiGe RFICs, ESD Protection for pHEMT RFICs, Electrostatic Discharge, RFICs, Radio-Frequency Integrated Circuits |
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