|  |
| |
| Artikel-Nr.:
858A-9783319089935 Herst.-Nr.:
9783319089935 EAN/GTIN:
9783319089935 |
| |
|
| | |
| Hot Carrier Degradation in Semiconductor Devices Weitere Informationen: | | Author: | Tibor Grasser | Verlag: | Springer International Publishing | Sprache: | eng |
|
| | |
| | | |
| Weitere Suchbegriffe: allgemeine technikbücher - englischsprachig, Elektronik / Mikroelektronik, Mikroelektronik, DegradationofSemiconductorDevicePerformance; HotCarrierDegradation; ReliabilityPhysicsandEngineering; SemiconductorDeviceLifetime; SemiconductorDeviceReliability, Degradation of Semiconductor Device Performance, Hot Carrier Degradation, Reliability Physics and Engineering, Semiconductor Device Lifetime, Semiconductor Device Reliability |
| | |
| |